材料期刊网

In order to further improve the resolution for a high-resolution electron hologram, the aberration working on the hologram must be corrected. Since it is rather difficult to precisely control aberration coefficients in the experimental stage, we proposed an amplitude contrast D criterion of imaging wave to determine the working aberration from the hologram itself. In the determination or correction of the aberration, we assume a symmetrical aberration function is parameterized only by a spherical aberration coefficient and a defocus value. First, D is calculated from a holographically reconstructed imaging wave of YBa2Cu3O7-x for each combination of these parameters. The working aberration on the imaging wave is determined from the combination of the parameters by noting the maximum or minimum D of the imaging wave at some specifically chosen thickness regions. The theoretical validity for the D criterion is then proved with three-beam dynamical diffraction formula. Finally, the 'experimental' examination for the D criterion is successfully performed on the reconstructed image wave for the Sigma = 9 interface structure of a wedge-shaped silicon sample. (C) 2001 Elsevier Science Ltd. All rights reserved.