New visible transparent, UV absorption, and high infrared reflection properties have been realized by depositing multilayer SiO2/ZnO: Al/CeO2-TiO2/SiO2 iflms onto glass substrates at low temperature by radio frequency magnetron sputtering. Optimum thickness of SiO2, ZnO: Al (ZAO) and CeO2-TiO2 (CTO) iflms were designed with the aid of thin iflm design software. The degree of antirelfection can be controlled by adjusting the thickness and refractive index. The outer SiO2 iflm can diminish the interference coloring and increase the transparency; the inner SiO2 iflm improves the adhesion of the coating on the glass substrate and prevents Ca2+, Na+ in the glass substrate from entering the ZAO iflm. The average transmittance in the visible light range increases by nearly 18%-20%, as compared to double layer ZAO/CTO iflms. And the iflms display high infrared relfection rate of above 75% in the wavelength range of 10-25 μm and good UV absorption (>98%) properties. These systems are easy to produce on a large scale at low cost and exhibit high mechanical and chemical durability. The triple functional iflms with high UV absorption, antirelfective and high infrared relfection rate will adapt to application in lfat panel display and architectural coating glass, automotive glass, with diminishing light pollution as well as decreasing eye fatigue and increasing comfort.
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