A low reset noise CMOS image sensor (CIS) based on column-level feedback reset is proposed. A feedback loop was formed through an amplifier and a switch. A prototype CMOS image sensor was developed with a 0.18μm CIS process. Through matching the noise bandwidth and the bandwidth of the amplifier, with the falling time period of the reset impulse 6 μs, experimental results show the reset noise level can experience up to 25 dB reduction. The proposed CMOS image sensor meets the demand of applications in high speed security surveillance systems, especially in low illumination.
参考文献
| [1] | Lauxtermann S,Lee A,Stevens J,et al.Comparison of global shutter pixels for CMOS image sensors.International Image Sensot Workshop,Ogunquit Maine,USA,2007 |
| [2] | Kleinfelder S,Bieser F,Chen Y,et al.Novel integrated CMOS sensor circuits.IEEE Trans Nucl Sci,2004,51(5):2328 |
| [3] | Fowler B,Godfrey M D,Mims S.Reset noise reduction in capacitive sensors.IEEE Trans Circuits Syst,2006,53(8):1658 |
| [4] | Li Binqiao,Sun Zhongyan,Xu Jiangtao.Wide dynamic range CMOS image sensor with in-pixel double-exposure and synthesis.Journal of Semiconductors,2010,31(5):055002 |
| [5] | Tian H,Fowler B,Gamal A E.Analysis of temporal noise in CMOS photodiode active pixel sensor.IEEE J Solid-State Circuits,2001,36(1):92 |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%