半导体学报（英文版）, 2015, 36(11): 103-107. doi: 10.1088/1674-4926/36/11/115008

基金项目: The Authors would like to thank the Innovative & Superior Technology Company for their analysis of UC1845AJ.

Experimental study on the single event effects in pulse width modulators by laser testing

Keywords： laser simulation

参考文献

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[5]	Liu Tianqi;Geng Chao;Zhang Zhangang;Zhao Fazhan;Gu Song;Tong Teng;Xi Kai.Impact of temperature on single event upset measurement by heavy ions in SRAM devices[J].半导体学报（英文版）,2014(8):98-103.
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[7]	Bi Jin-Shun;Zeng Chuan-Bin;Gao Lin-Chun;Liu Gang;Luo Jia-Jun;Han Zheng-Sheng.Estimation of pulsed laser-induced single event transient in a partially depleted silicon-on-insulator 0.18-μm MOSFET[J].中国物理B（英文版）,2014(8):631-635.

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