基于正负电荷间的静电作用制备了具有核-壳结构的聚苯乙烯-氧化硅(PS-SiO2)杂化颗粒,通过调节正硅酸乙酯的用量对样品的SiO2壳层厚度进行控制.利用原子力显微镜(AFM)在微观尺度上测定杂化颗粒的力-位移曲线,根据Hertz接触模型和Sneddon接触模型,考查了SiO2壳层厚度对样品压缩弹性模量的影响.扫描电子显微镜(SEM)和透射电镜(TEM)结果显示,杂化颗粒中PS内核尺寸为(197士9)nm,壳层由SiO2纳米颗粒组成,在本试验范围内杂化颗粒样品的壳厚为11～16 nm.在Hertz接触模型条件下,PS微球的弹性模量为(2.2±0.5) GPa,其数值略低于PS块体材料.当SiO2壳厚由11 nm增至16 nm时,杂化颗粒的弹性模量从(4.4士0.6) GPa增至(10.2士1.1) GPa,其数值明显低于纯SiO2,且更接近于PS内核.
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