为探讨电晕放电引起聚酰亚胺(PI)薄膜绝缘老化的原因,利用扫描电镜(SEM)分别研究了纯PI薄膜和PI/Al2O3复合薄膜在电晕放电下老化击穿的特点,并通过重复电晕老化击穿实验统计了薄膜击穿位置出现的规律.结果表明:电晕老化击穿后纯PI薄膜和PI/Al2O3复合薄膜均形成了直径约为20μm的圆形击穿孔,统计击穿孔的位置发现大多数击穿位置集中在特定的圆心区和边缘区,只有少数击穿发生在电晕破坏环上,说明电晕放电对薄膜的破坏并不是引起薄膜最终老化击穿的主要原因,电晕放电产生大量的热量在薄膜上积累引发的热击穿导致薄膜最终发生了热老化击穿.
In order to explore the failure mechanism of polyimide (PI) film caused by corona discharge, scanning electron microscopy (SEM) was used to study the breakdown points of pure PI and PI/Al2O3 composites films under corona ageing, and the breakdown position were counted and analyzed through repeated breakdown tests. The results show that there is a circular hole whose size is about 20μm at the surface of PI and PI/Al2O3 composites films after corona ageing breakdown. Most breakdown points concentrate in the center zone and the edge zone, only a few breakdown points occur in the destruction zone of corona, which indicate that the destruction of corona discharge on the film is not the main reason of breakdown, but a lot of heat generated during corona discharge result in breakdown of films.
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