TiAl-W-Si合金中的偏析与析出相的分析电子显微术研究

金属学报, 2002, 38(z1): 444-448. doi: 10.3321/j.issn:0412-1961.2002.z1.140

TiAl-W-Si合金中的偏析与析出相的分析电子显微术研究

于荣 ^1, , 贺连龙 ^2, , 程志英 ^3, , 朱静 ^4, , 叶恒强 ^5,

1.中国科学院金属研究所沈阳材料科学国家(联合)实验室,沈阳,110016

2.中国科学院金属研究所沈阳材料科学国家(联合)实验室,沈阳,110016

3.清华大学材料科学与工程研究所电子显微学实验室,北京,100084

4.清华大学材料科学与工程研究所电子显微学实验室,北京,100084

5.中国科学院金属研究所沈阳材料科学国家(联合)实验室,沈阳,110016

基金项目: 国家自然科学基金

关键词：分析电子显微术 , TiAl , 析出相 , 偏析

INVESTIGATIONS OF SEGREGATION AND PRECIPITATES IN A TiAl-W-Si ALLOY BY ANALYTICAL ELECTRON MICROSCOPY

用高空间分辨分析电子显微术研究了TiAl-W-Si合金中B2相的析出行为和元素W的分布.结果表明,α2/γ相界面台阶由于W的富集而成为B2析出相的择尤形核位置.B2相中,高达三分之一的Al原子被W原子置换,而在γ相中只固溶了很有限的W.另外,W也偏析在α2/γ和B2/γ相界面上.这些结果合理地解释了W对提高TiAl合金蠕变性能的显著作用.

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TiAl-W-Si合金中的偏析与析出相的分析电子显微术研究

INVESTIGATIONS OF SEGREGATION AND PRECIPITATES IN A TiAl-W-Si ALLOY BY ANALYTICAL ELECTRON MICROSCOPY

参考文献