基于X射线应力测量原理,建立了一种双相材料相间内应力的测量与表征方法.利用衍射谱线上两相的衍射峰位差,有效地消除了仪器的系统误差.测量了实际材料SiCp/6061Al中的相间内应力,证实该方法具有较高的测量精度.
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