将具有{001}〈UV0〉取向的柱状晶Ni样品分别冷轧到0%,10%,30%和50%,用电子背散射图(EBSP)技术测量晶粒取向,跟踪晶粒取向在轧制过程中的演变,得到晶粒取向演变的统计性结果.采用Taylor模型模拟晶粒取向的演变,并与实验结果比较.结果表明,晶粒取向的演变主要受原取向的影响,只有一部分晶粒取向的演变符合Taylor模型.
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