利用硅胶吸附一解吸臭氧原理自制了臭氧浓缩装置,通过此装置制备的高浓度臭氧作为分子束外延制备Bi系氧化物薄膳的氧化源.在臭氧浓缩装置中,硅胶温度保持在-85℃左右,工作6 h,可获得浓度(摩尔分数)高于95%的臭氧,当臭氧浓缩装置中压强保持在1.3×103Pa,该臭氧浓度可维持5 h以上.X射线衍射结果表明,制备的高浓度臭氧在高真空条件下可将Cu氧化成CuO,并以此为氧化源利用分子束外延在MgO(100)衬底上制备了较高质量的Bi2Sr2CuO6+x和Bi2Sr2CaCu2O8+x薄膜.
参考文献
[1] | Bove P,Rogers D J,Hosseini Teherani F.J Cryst Growth,2000; 220:68 |
[2] | Brazdeikis A,Karlsson U O,Flodstrom A S.Thin Solid Films,1996; 281-282:57 |
[3] | Schlom D G,Marshall A F,Sizemore J T,Chen Z J,Eckstein J N,Bozovic I,Von Dessonneck K E,Harris J S Jr,Bravman J C.J Cryst Growth,1990; 102:361 |
[4] | Nakayama Y,Tsukada I,Uchinokura K.J Appl Phys,1991; 70:4371 |
[5] | Qi Y,Sakai K,Murakami H,Ito T.Appl Surf Sci,2001;169-170:335 |
[6] | Ingrey S,Lau W M,McIntyre N S.J Vac Sci Technol,1986; 4A:984 |
[7] | Halder S,Schneller T,Meyer R,Waser R.J Appl Phys,2005; 97:114904 |
[8] | Hosokawa S,Ichimura S.Rev Sci Instrum,1991; 62:1614 |
[9] | Gibbons B J,Fan Y,Findikoglu A T,Jia Q X,Reagor D W.J Vac Sci Technol,2001; 19A:56 |
[10] | Kubinski D J,Hoffman D W,Soltis R E,Logothetis E M.J Appl Phys,1992; 71:1860 |
[11] | Reidy S,Varhue W J,Lavoie M,Mongeon S,Adams E.J Vac Sci Technol,2003; 21B:970 |
[12] | Koike K,Fukuda T,Ichimura S,Kurokawa A.Rev Sci Instrum,2000; 71:4182 |
[13] | Huang Y E,Jia J F.Hebei Chem Eng Ind,2006; (2):6(黄艳娥,贾俊芳.河北化工,2006;(2):6) |
[14] | Chen Y M,Ling Y M.Chin J Electron Devices,2004; 27:653(陈艳梅,凌一鸣.电子器件,2004;27:653) |
[15] | Hanson D,Mauersberger K.J Chem Phys,1985; 83:326 |
[16] | Hanson D,Mauersberger K.J Chem Phys,1986; 85:4669 |
[17] | Cook G A,Kiffer A D,Klumpp C V,Malik A H,Spence L A.In:Leedy H A ed.,Advances in Chemistry Series,American Chemical Society,Washington,DC,1956:44 |
[18] | Caprio V,Lignola P G,Insola A.Anal Chem,1980; 52:1123 |
[19] | Streng A G.J Chem Eng Data,1961; 6:431 |
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