利用原子力显微镜研究了氯化镁介质中氧化铝表面的相互作用力随盐浓度、pH的变化规律.在中性条件下,当MgCl2盐浓度由10-5mol/L增加到10-2mol/L时,长程排斥作用由于双电层压缩,作用范围从一百多纳米减弱到十几纳米,实验测得的双电层厚度的实际值与理论值较好的吻合.保持MgCl2介质浓度不变,pH由3.64变化到9.09,氧化铝表面的相互作用始终表现为排斥力,与测得的Zeta电位值始终为正值相一致.当pH=9.5时,由于镁离子的水合氢氧化物在氧化铝表面的特性吸附,产生了短程非静电排斥力,首次用原子力显微镜证实了Mg2+特性吸附层的存在,厚度约为5nm.
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