用中频交流反应磁控溅射方法制备了N掺杂的TiO2薄膜.利用光电子能谱(XPS)对薄膜的成分进行了分析,并研究了薄膜的可见光吸收性能.结果表明:反应气体中N2的质量分数是影响薄膜中Ti-N键的主要因素;在N2气氛中380℃退火有利于提高N掺杂的含量;厚度的增加使薄膜的吸收性能在紫外到可见光区都有提高;含N量为1.5%的TiO2-xNx薄膜吸收限由TiO2薄膜的387nm红移至441nm.
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