应用扫描力显微镜(SFM)的压电响应模式观测未经抛光处理的PZT陶瓷片的电畴结构,用纵向压电响应信号和侧向压电响应信号获得PZT陶瓷材料三维电畴结构.结果表明,将样品晶粒的微形貌与SFM的纵向和侧向压电响应信号相结合,能准确表征粗大晶粒样品的三维电畴结构.用SFM可观测表面不经任何处理的陶瓷样品的电畴,不会引入表面应力等影响因素,能得到样品的原生畴结构.对原生畴结构的观察表明,对于受应力较大的晶粒,成畴的主要原因是降低应变能,而受应力较小的晶粒成畴的主要原因是降低退极化能.
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