研究了掺杂Ce2O3和Gd2O3对ZnO-Bi2O3系压敏陶瓷电气性能的影响,发现大尺寸试样的内层电位梯度明显低于表层,即表现出"软心"特征."软心"导致试样平均电位梯度随着试样几何尺寸的增大而下降.沿轴向晶粒尺寸没有明显的差异.根据沿轴向截取的等厚薄片的电流与温度的关系,发现表层的晶界势垒高度比内层的高.这种晶界势垒高度的非均匀分布可能与添加稀土氧化物后造成的氧元素分布不均匀有关.
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