在原子尺度观察组织结构并理解它和性质之间的关系是物质科学追求的目标之一纳米科技、信息器件微型化、先进制造精密化等领域的快速发展,对材料显微表征深入到原子排列、电子结构层次起到了重要的推动作用.集形貌观察、结构诠释、元素分析于一身的透射电子显微镜近年来因像差校正器的突破而有望将上述三项功能都推进到原子分辨水平.本文介绍像差校正电子显微镜给材料显微研究带来的新契机:(1)像差校正电子显微学(提高分辨率、减少离位效应、负球差成像、系列离焦像);(2)走向原子柱元素分辨的化学分析;(3)三维原子像;(4)复杂结构的界面;(5)时间分辨电子显微术;(6)电子全息;(7)原位电子显微术(较大极靴间隙).
参考文献
[1] | Li D X,Ping D H,Ye H Q,Qin X Y,Wu X J.Mater Lett,1993;18:29 |
[2] | Watanabe M,Ackland D W,Burrows A,Kiely C J,Williams D B,Krivanek O L,Dellby N,Murfitt M F,Szilagyi Z.Microsc Microanal,2006;12:515 |
[3] | Erni R,Browning N D.In:Tanaka N,Takano Y,Mori H,Seguchi H,Iseki S,Shimada H,Simamura E,eds.,Proc Asia-Pacific Conference on Electron Microscopy (8 APEM),Kanazawa:8 APEM Publication Committee,2004:130 |
[4] | Seidel L.Astr Nachr,1856;43:289 |
[5] | Klein M V.Optics.Wiley,Chichester,Sussex,UK,1970:141 |
[6] | Scherzer O.Z Phys,1936;101:23 |
[7] | Scherzer O.Optik,1948;4:258 |
[8] | Septier A.In:Valdre U,ed,Electron Microscopy in Material Science.Chapter 2,Academic Press New York and London,1971:14 |
[9] | Krivanek O L,Ursin J P,Bacon N J,Corbin G J,Dellby N,Hrncirik P,Murfitt M F,Own C S,Szilagyi Z S.Philos Trans R Soc,2009;367A:3683 |
[10] | Rayleigh L.Philos Mag,1879;8:463 |
[11] | Haider M,Muller H,Uhlemann S,Zach J,Loebau U,Hoeschen R.Ultramicroscopy,2008;108:167 |
[12] | Haider M,Hartel P,Midler H,Uhlemann S,Zach J.Philos Trans R Soc,2009;367A:3665 |
[13] | Zach J,Haider M.Optik,1995;98:112 |
[14] | Dellby N,Krivanek 0 L,Nellist P D,Batson P E,Lupini R.JEM,2001;50(3):177 |
[15] | Krivanek O L,Corbin G J,Dellby N,Elston B F,Keyse R J,Murfitt M F,Own C S,Szilagyi Z S,Woodruff J W.Ultramicroscopy,2008;108:179 |
[16] | Erni R,Rossell M D,Kisielowski C,Dahmen U.Phys Rev Lett,2009;102:096101 |
[17] | Ling T,Xie L,Zhu J,Yu H M,Ye H Q,Yu R,Cheng Z Y,Liu L,Yang G W,Cheng Z D,Wang Y J,Ma X L.Nano Lett,2009;9:1572 |
[18] | Lu N,Yu R,Chen Z Y,Pai Y J,Zhang X W,Zhu J.Appl Phys Lett,2010;96:221905 |
[19] | Urban K W,Jia C L,Houben L,Lentzen M,Mi S B,Tillmann K.Philos Trans R Soc,2009;367A:3735 |
[20] | Houben L,Thust A,Urban K.Ultramicroscopy,2006;106:200 |
[21] | Coene W,Janssen G,Op de Beek M,Van Dyck D.Phys Rev Lett,1992;69:3743 |
[22] | O'Keefe M A.Ultramicroscopy,2008;108:196 |
[23] | Muller D A,Kourkoutis L F,Murfitt M,Song J H,Hwang H Y,Silcox J,Dellby N,Krivanek O L.Science,2008;319:1073 |
[24] | Born Max,Wolf Emil.Translated by Yang X S et al.Principles of Optics.5th Ed.,Beijing:Science Press,1978:578(Born Max,Wolf Emil 著;杨葭荪等译.光学原理.北京:科学出版社,1978:578) |
[25] | Dahmen U,Erni R,Radmilovic V,Ksielowski C,Rossell M D,Denes P.Philos Trans R Soc,2009;367A:3795 |
[26] | Chisholm M F,Kumar S,Hazzledine P.Science,2005;307:701 |
[27] | King W E,Cambell G H,Flunk A,Reed B,Schmerge J F,Siwick B J,Staart B C,Weber P M.J Appl Phys,2005;97:11110 |
[28] | Masiel D J,Reed B W,LaGrange T B,Campbell G H,Guo T,Browning N D.Chem Phys Chem,2010;11:208 |
[29] | Gabor D.Nature,1948;161:777 |
[30] | Lichte H,Geiger D,Linck M.Philos Trans R Soc,2009;367A:3773 |
[31] | Ye H Q,Wang Y M.Progress in Transmission Electron Microscopy.Chapter B5,Beijing:Science Press,2003:217(叶恒强,王元明主编.透射电子显微学进展.第B5章,北京:科学出版社,2003:217) |
[32] | Lichte H,Formanek P,Lenk A,Linck M,Matzeck C,Lehmann M,Simon P.Annu Rev Mater Res,2007;37:539 |
[33] | McCartney M R,Agarwal N,Chung S,Cullen D A,Han M G,He K,Li L Y,Wang Ha,Zhou L,Smith D J.Ultramicroscopy,2010;110:375 |
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