采用Zr箔/Cu箔/Zr箔中间层对Ti(C,N)-Al2O3陶瓷基复合材料进行部分瞬间液相扩散连接实验,研究保温时间对元素扩散及界面反应产物的影响,探讨了制约接头室温强度的因素,对比分析了在部分瞬间液相扩散连接过程中,辅助脉冲电流对元素扩散及接头强度的作用机制.结果表明,预置Zr箔/Cu箔/Zr箔中间层通过部分瞬间液相扩散连接,在加热温度950℃,保温时间15~30 min条件下接头强度达到最大值.保温时间过短,活性元素Zr削弱基体强度,保温时间过长,Zr与Cu在界面生成金属间化合物降低了接头的强度.扩散焊过程中施加辅助脉冲电流能够有效缓解接头的残余应力,防止裂纹在脆性基体材料中扩展;但是同时促进了界面处的反应进程,显著提高了界面处Cu-Zr金属间化合物的形成速度,使得界面易成为接头的薄弱环节.
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