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利用直流磁控溅射方法制备了GaN薄膜. X射线衍射及Raman光谱结果表明薄膜样品为非晶结构; 傅立叶红外光谱表明薄膜样品的主要吸收峰为Ga--N键的伸缩振动; 光致发光测试得到了360nm处的紫外发光谱; 测量薄膜样品的紫外-可
见谱, 并利用Tauc公式计算得到样品的光学带隙为3.74eV, 这与光致发光谱得到的结果是一致的.

GaN thin films were prepared by direct current (DC) planar magnetron sputtering on Si and SiO$_2$. The films were characterized by X-ray diffraction (XRD), Raman, Fourier Transform Infrared Spectroscopy (FTIR), photoluminescence (PL) and UV-Vis spectra. XRD and Raman spectrum show that the films are amorphous. Fourier infrared absorbance spectrum shows
that the main absorbance is Ga-N stretching vibration. 360nm ultraviolet emission is obtained at room temperature. UV-Vis result shows that the optical band gap of the films is 3.74eV, which is consistent with photoluminescence spectrum result.
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