常规馈通电压计算原理涉及到 OLED 体的电容值，不同型号 OLED 产品电容值是个变量，为了得到最佳的电容值， OLED 制造企业测试部门需做大量的验证实验。本文直接通过栅极电压上拉使 OLED 体的储存电容产生馈通电压来补偿栅极电压关闭时栅极和漏极之间寄生电容产生的馈通电压，无需测量 OLED 体的电容值和修正 V com 值即可补偿栅极电压关闭时栅极和漏极之间的寄生电容产生的馈通电压。实验结果表明，基于馈通电压自动补偿原理设计的 Shorting Bar Test Waveform 与 Vcom 人工修正原理设计的电性能测试波形的检测效果一致，而对不同缺陷的检测率有微小差异。
The conventional calculation principle for the feed through voltage relates to capacitance val-ues of OLED body,and capacitance values of different OLED products is variable.A lot of experi-ments must be done by testing department of OLED manufacturing enterprise in order to get the best capacitance values of OLED body.This paper directly pulls up gate voltage,and then the storage ca-pacitor of OLED body produces a feed through voltage to compensate the feed through voltage genera-ted by the parasitic capacitance between the gate and the drain as the gate voltage closing.Experiment result shows that the total detection rate using the testing waveform based on automatic compensation principle or conventional compensation is consistent,and there is little difference on the detection rate of different defects.
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