从单晶硅内氢杂质的引入,氢钝化施主,钝化受主,钝化缺陷等几方面对近年来单晶硅内氢杂质的特性研究进行了综述,强调了氢加速氧扩散、加速热施主与氧沉淀的形成等性质,讨论了氢在单晶硅内的存在状态及硅片在氢气氛中的退火特性.
参考文献
[1] | Yarykin N;Sachse JU;Weber J;Lemke H .Electrically active silver-hydrogen complexes in silicon[J].Materials Science Forum,1997(0):301-306. |
[2] | Pearton S J;Corbett J W;Shi T S Appl .[J].Journal of Applied Physiology,1987,A43:153. |
[3] | North-Holland.[M].Elsevier Science publishers,1991 |
[4] | Pearton S J;Corbett J W;Stavola M.Hydrogen in Crystalline Semiconductors[M].Berlin: Springer verlag,1992 |
[5] | pankove J I;Johnson N M.Hydrogen in semiconductors. Semiconductors and semimetals, vol.34[M].New York:Academic press INC,1991 |
[6] | Murakami K;Fukata N;Sasaki S et al.[J].Physical Review Letters,1996,77(15):3161. |
[7] | Stefan K;Estreicher .[J].Physical Review B,1990,41(14):9886. |
[8] | Ulyashin A G;Ivanov A I;Job R et al.[J].Materials Science and Engineering B,1999,58:64. |
[9] | Wijaeanakula W .[J].Journal of Applied Physics,1993,73(02):1004. |
[10] | Ulyashin AG.;Job R.;Fahrner WR.;Khorunzhii IA. .Characterization of the oxygen distribution in Czochralski silicon using hydrogen-enhanced thermal donor formation[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):124-129. |
[11] | Job R.;Ulyashin AG.;Fahrner WR. .Electronic device fabrication by simple hydrogen enhanced thermal donor formation processes in p-type Cz-silicon[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):197-202. |
[12] | Ulyashin A G;Ivanov A I;Khorunzhii I A et al.[J].Materials Science and Engineering B,1999,58:91. |
[13] | Maddalon-Vinante C;Barbier D;Erramli H et al.[J].Journal of Applied Physics,1993,74(10):6115. |
[14] | Li Huaixiang;Xue Chengshan;Chen Lusheng et al.[J].Materials Science and Engineering B,2000,72:105. |
[15] | 李怀祥;薛成山;周武 .[J].山东师大学学报(自然科学版),1998(13):271. |
[16] | Izunome K;Shirai H;Kashima K et al.[J].Applied Physics Letters,1996,68:49. |
[17] | Sueoka K;Akatsuka M;Katahama H .[J].Journal of the Electrochemical Society,1999,146(06):2318. |
[18] | Aogama T;Goto K;Yamazaki T Sci et al.[J].Technol A,1996,14:2909. |
[19] | Vatel O;Verhaverbeke S;Bender H et al.[J].Japanese Journal of Applied Physics,1993,32:1489. |
[20] | Nauka K;Kamins T I .[J].Journal of the Electrochemical Society,1999,146(01):292. |
[21] | Mukasjhev B N;Tokmoldin S Z .[J].Materials Science Forum,1995,196-201:843. |
[22] | Leitch A W R;Weber J;Alex V .[J].Materials Science and Engineering B,1999,58:6. |
[23] | Grf D;Lambert U;Brohl M .[J].Journal of the Electrochemical Society,1995,142(09):3189. |
[24] | 刘桂荣,李怀祥,陈燕生,段淑贞.轻/重水堆中子辐照氢区熔硅退火特性的比较[J].稀有金属,1998(04):259-263. |
[25] | Sachse J U;Weber J;Lemke H Mat Sci .[J].Forum-American Bar Association,1997,258-263:307. |
[26] | Sachse J U;Sveinbjornsson E O;Yarykin N .[J].Materials Science and Engineering B,1999,58:134. |
[27] | Shiraishi M;Sachse J U;Lemke H .[J].Materials Science and Engineering B,1999,58:130. |
[28] | Knack S;Weber J;Lemke H Mat .[J].Materials Science and Engineering B,1999,58:141. |
[29] | Zhou Y;Luchsinger R;Meier P F .[J].Materials Science Forum,1995,196-201:885. |
[30] | Borenstein J T;Corbett J W;Pearton S J .[J].Journal of Applied Physics,1993,73(06):2751. |
[31] | Stein H J;Myers S M;Follstaedt D M .[J].Journal of Applied Physics,1993,73(06):2755. |
[32] | Fukata N;Ujimura S F;Muralao K .[J].Materials Science Forum,1995,196-201:873. |
[33] | Jones R;Resene A;Berg S et al.[J].Materials Science and Engineering B,1999,58:113. |
[34] | Resende A;Goss J;Briddon P R Mat Sci et al.[J].Forum-American Bar Association,1997,258-263:295. |
[35] | EVANS M J;Stavola M;Weinstein M G .[J].Materials Science and Engineering B,1999,58:118. |
[36] | Resende A;Jones R;Berg S et al.[J].Materials Science and Engineering B,1999,58:146. |
[37] | Koukersu M;Watanabe K;Isomae S .[J].Materials Science Forum,1995,196-201:861. |
[38] | Hourahine B;Jones R;Oberg S;Briddon PR .Anomalous shift of the 1075cm(-1) oxygen-hydrogen defect in silicon[J].Materials Science Forum,1997(0):277-282. |
[39] | Markevich VP.;Suezawa M. .Hydrogen-oxygen interaction in silicon at around 50 degrees C[J].Journal of Applied Physics,1998(6):2988-2993. |
[40] | Markevich V P;Suezawa M;Sumino K .[J].Materials Science Forum,1995,196-201:915. |
[41] | Markevich V P;Suezawa M;Murin L I.[J].Materials Science and Engineering B,1999:58:26. |
[42] | Mainwood A .The trapping of hydrogen at carbon defects in silicon[J].Materials Science Forum,1997(0):253-258. |
[43] | Kamiura Y;Ishiga N;Ohyama S;Yamashita Y .Structure and charge-state-dependent instability of a hydrogen-carbon complex in silicon[J].Materials Science Forum,1997(0):247-252. |
[44] | Hiroshi C;Yoshida K .[J].Materials Science Forum,1995,196-201:897. |
[45] | Safonov AN;Lightowlers EC .The M-line (760.8meV) luminescence system associated with the carbon-hydrogen acceptor centre in silicon[J].Materials Science Forum,1997(0):259-264. |
[46] | Gower J;Davies G;Lightowlers EC;Safonov AN .The I centre: A hydrogen related defect in silicon[J].Materials Science Forum,1997(0):289-294. |
[47] | Ishioka K;Nakamura KG;Kitajima M;Fukata N;Murakami K;Fujimura S;Kikuchi J .Trapping site of hydrogen molecule in crystalline silicon[J].Materials Science Forum,1997(0):235-240. |
[48] | Feklisova O V;Yakimov E B;Yarykin N A et al.[J].Materials Science and Engineering B:Solid-state Materials for Advanced Technology,1999,58:60. |
[49] | Afanas'ev V V;Stesmans A;Mat .[J].Science and engineering B,1999,58:56. |
[50] | Leitch AWR;Alex V;Weber J .Formation and structure of hydrogen molecules in crystalline Si[J].Materials Science Forum,1997(0):241-246. |
[51] | Katashiro M.;Ohta R.;Matsumoto K. .ANALYSIS AND APPLICATION OF HYDROGEN SUPPLYING PROCESS IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES[J].Journal of the Electrochemical Society,1996(11):3771-3777. |
[52] | Danel A;Tardif F;Kamarinos G Mat .[J].Materials Science and Engineering B:Solid-state Materials for Advanced Technology,1999,58:64. |
[53] | Bollani M.;Layet JM.;Charai A.;Narducci D.;Portail M. .Final evidence for H termination of HF-treated Si surfaces: a comparative study by high-energy and vibrational spectroscopies[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):240-243. |
[54] | Ogawa H;Ishikawa K;Fujimura S .[J].Journal of the Electrochemical Society,1996,143(09):2995. |
[55] | Kitajima M;Ishioka K;Tateishi S et al.[J].Materials Science and Engineering B,1999,58:13. |
[56] | Hourahine B;Jones R;Berg S et al.[J].Materials Science and Engineering B,1999,58:24. |
[57] | Estreicher S K;Hastings J L;Fedders P A .[J].Materials Science and Engineering B,1999,58:31. |
[58] | Pritchard R E;Ashuwin M J;Newman R C et al.[J].Materials Science and Engineering B,1999,58:1. |
[59] | Pritchard RE;Ashwin MJ;Newman RC;Tucker JH;Lightowlers EC;Binns MJ;Falster R;McQuaid SA .Vibrational absorption from oxygen-hydrogen (O-i-H-2) complexes in hydrogenated CZ silicon[J].Materials Science Forum,1997(0):283-288. |
[60] | Nielsen KB;Nielsen BB;Hansen J .Low-temperature migration of hydrogen and interaction with oxygen[J].Materials Science Forum,1997(0):271-276. |
[61] | Nielsen K B;Nieslen B B;Mat .[J].Materials Science and Engineering B,1999,58:163. |
[62] | Godey S;Ntsoenzok E;Schmidt D C et al.[J].Materials Science and Engineering B,1999,58:108. |
[63] | Sueoka K;Akatsuka M;Katahama H et al.[J].Journal of the Electrochemical Society,1999,146(01):364. |
[64] | Yamada N;Yamada-kaneta H .[J].Journal of the Electrochemical Society,1998,145:3628. |
[65] | Abe Hidenobu;Suzuki Isamu;Koya Hiroshi .[J].Journal of the Electrochemical Society,1997,144(01):306. |
[66] | Stesmans A;Afanasev V V .[J].Materials Science and Engineering B,1999,58:71. |
[67] | Binns M J;Newman R C;Mcquaid S et al.[J].Materials Science Forum,1995,196-201:861. |
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