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从单晶硅内氢杂质的引入,氢钝化施主,钝化受主,钝化缺陷等几方面对近年来单晶硅内氢杂质的特性研究进行了综述,强调了氢加速氧扩散、加速热施主与氧沉淀的形成等性质,讨论了氢在单晶硅内的存在状态及硅片在氢气氛中的退火特性.

参考文献

[1] Yarykin N;Sachse JU;Weber J;Lemke H .Electrically active silver-hydrogen complexes in silicon[J].Materials Science Forum,1997(0):301-306.
[2] Pearton S J;Corbett J W;Shi T S Appl .[J].Journal of Applied Physiology,1987,A43:153.
[3] North-Holland.[M].Elsevier Science publishers,1991
[4] Pearton S J;Corbett J W;Stavola M.Hydrogen in Crystalline Semiconductors[M].Berlin: Springer verlag,1992
[5] pankove J I;Johnson N M.Hydrogen in semiconductors. Semiconductors and semimetals, vol.34[M].New York:Academic press INC,1991
[6] Murakami K;Fukata N;Sasaki S et al.[J].Physical Review Letters,1996,77(15):3161.
[7] Stefan K;Estreicher .[J].Physical Review B,1990,41(14):9886.
[8] Ulyashin A G;Ivanov A I;Job R et al.[J].Materials Science and Engineering B,1999,58:64.
[9] Wijaeanakula W .[J].Journal of Applied Physics,1993,73(02):1004.
[10] Ulyashin AG.;Job R.;Fahrner WR.;Khorunzhii IA. .Characterization of the oxygen distribution in Czochralski silicon using hydrogen-enhanced thermal donor formation[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):124-129.
[11] Job R.;Ulyashin AG.;Fahrner WR. .Electronic device fabrication by simple hydrogen enhanced thermal donor formation processes in p-type Cz-silicon[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):197-202.
[12] Ulyashin A G;Ivanov A I;Khorunzhii I A et al.[J].Materials Science and Engineering B,1999,58:91.
[13] Maddalon-Vinante C;Barbier D;Erramli H et al.[J].Journal of Applied Physics,1993,74(10):6115.
[14] Li Huaixiang;Xue Chengshan;Chen Lusheng et al.[J].Materials Science and Engineering B,2000,72:105.
[15] 李怀祥;薛成山;周武 .[J].山东师大学学报(自然科学版),1998(13):271.
[16] Izunome K;Shirai H;Kashima K et al.[J].Applied Physics Letters,1996,68:49.
[17] Sueoka K;Akatsuka M;Katahama H .[J].Journal of the Electrochemical Society,1999,146(06):2318.
[18] Aogama T;Goto K;Yamazaki T Sci et al.[J].Technol A,1996,14:2909.
[19] Vatel O;Verhaverbeke S;Bender H et al.[J].Japanese Journal of Applied Physics,1993,32:1489.
[20] Nauka K;Kamins T I .[J].Journal of the Electrochemical Society,1999,146(01):292.
[21] Mukasjhev B N;Tokmoldin S Z .[J].Materials Science Forum,1995,196-201:843.
[22] Leitch A W R;Weber J;Alex V .[J].Materials Science and Engineering B,1999,58:6.
[23] Grf D;Lambert U;Brohl M .[J].Journal of the Electrochemical Society,1995,142(09):3189.
[24] 刘桂荣,李怀祥,陈燕生,段淑贞.轻/重水堆中子辐照氢区熔硅退火特性的比较[J].稀有金属,1998(04):259-263.
[25] Sachse J U;Weber J;Lemke H Mat Sci .[J].Forum-American Bar Association,1997,258-263:307.
[26] Sachse J U;Sveinbjornsson E O;Yarykin N .[J].Materials Science and Engineering B,1999,58:134.
[27] Shiraishi M;Sachse J U;Lemke H .[J].Materials Science and Engineering B,1999,58:130.
[28] Knack S;Weber J;Lemke H Mat .[J].Materials Science and Engineering B,1999,58:141.
[29] Zhou Y;Luchsinger R;Meier P F .[J].Materials Science Forum,1995,196-201:885.
[30] Borenstein J T;Corbett J W;Pearton S J .[J].Journal of Applied Physics,1993,73(06):2751.
[31] Stein H J;Myers S M;Follstaedt D M .[J].Journal of Applied Physics,1993,73(06):2755.
[32] Fukata N;Ujimura S F;Muralao K .[J].Materials Science Forum,1995,196-201:873.
[33] Jones R;Resene A;Berg S et al.[J].Materials Science and Engineering B,1999,58:113.
[34] Resende A;Goss J;Briddon P R Mat Sci et al.[J].Forum-American Bar Association,1997,258-263:295.
[35] EVANS M J;Stavola M;Weinstein M G .[J].Materials Science and Engineering B,1999,58:118.
[36] Resende A;Jones R;Berg S et al.[J].Materials Science and Engineering B,1999,58:146.
[37] Koukersu M;Watanabe K;Isomae S .[J].Materials Science Forum,1995,196-201:861.
[38] Hourahine B;Jones R;Oberg S;Briddon PR .Anomalous shift of the 1075cm(-1) oxygen-hydrogen defect in silicon[J].Materials Science Forum,1997(0):277-282.
[39] Markevich VP.;Suezawa M. .Hydrogen-oxygen interaction in silicon at around 50 degrees C[J].Journal of Applied Physics,1998(6):2988-2993.
[40] Markevich V P;Suezawa M;Sumino K .[J].Materials Science Forum,1995,196-201:915.
[41] Markevich V P;Suezawa M;Murin L I.[J].Materials Science and Engineering B,1999:58:26.
[42] Mainwood A .The trapping of hydrogen at carbon defects in silicon[J].Materials Science Forum,1997(0):253-258.
[43] Kamiura Y;Ishiga N;Ohyama S;Yamashita Y .Structure and charge-state-dependent instability of a hydrogen-carbon complex in silicon[J].Materials Science Forum,1997(0):247-252.
[44] Hiroshi C;Yoshida K .[J].Materials Science Forum,1995,196-201:897.
[45] Safonov AN;Lightowlers EC .The M-line (760.8meV) luminescence system associated with the carbon-hydrogen acceptor centre in silicon[J].Materials Science Forum,1997(0):259-264.
[46] Gower J;Davies G;Lightowlers EC;Safonov AN .The I centre: A hydrogen related defect in silicon[J].Materials Science Forum,1997(0):289-294.
[47] Ishioka K;Nakamura KG;Kitajima M;Fukata N;Murakami K;Fujimura S;Kikuchi J .Trapping site of hydrogen molecule in crystalline silicon[J].Materials Science Forum,1997(0):235-240.
[48] Feklisova O V;Yakimov E B;Yarykin N A et al.[J].Materials Science and Engineering B:Solid-state Materials for Advanced Technology,1999,58:60.
[49] Afanas'ev V V;Stesmans A;Mat .[J].Science and engineering B,1999,58:56.
[50] Leitch AWR;Alex V;Weber J .Formation and structure of hydrogen molecules in crystalline Si[J].Materials Science Forum,1997(0):241-246.
[51] Katashiro M.;Ohta R.;Matsumoto K. .ANALYSIS AND APPLICATION OF HYDROGEN SUPPLYING PROCESS IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES[J].Journal of the Electrochemical Society,1996(11):3771-3777.
[52] Danel A;Tardif F;Kamarinos G Mat .[J].Materials Science and Engineering B:Solid-state Materials for Advanced Technology,1999,58:64.
[53] Bollani M.;Layet JM.;Charai A.;Narducci D.;Portail M. .Final evidence for H termination of HF-treated Si surfaces: a comparative study by high-energy and vibrational spectroscopies[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2000(1/3):240-243.
[54] Ogawa H;Ishikawa K;Fujimura S .[J].Journal of the Electrochemical Society,1996,143(09):2995.
[55] Kitajima M;Ishioka K;Tateishi S et al.[J].Materials Science and Engineering B,1999,58:13.
[56] Hourahine B;Jones R;Berg S et al.[J].Materials Science and Engineering B,1999,58:24.
[57] Estreicher S K;Hastings J L;Fedders P A .[J].Materials Science and Engineering B,1999,58:31.
[58] Pritchard R E;Ashuwin M J;Newman R C et al.[J].Materials Science and Engineering B,1999,58:1.
[59] Pritchard RE;Ashwin MJ;Newman RC;Tucker JH;Lightowlers EC;Binns MJ;Falster R;McQuaid SA .Vibrational absorption from oxygen-hydrogen (O-i-H-2) complexes in hydrogenated CZ silicon[J].Materials Science Forum,1997(0):283-288.
[60] Nielsen KB;Nielsen BB;Hansen J .Low-temperature migration of hydrogen and interaction with oxygen[J].Materials Science Forum,1997(0):271-276.
[61] Nielsen K B;Nieslen B B;Mat .[J].Materials Science and Engineering B,1999,58:163.
[62] Godey S;Ntsoenzok E;Schmidt D C et al.[J].Materials Science and Engineering B,1999,58:108.
[63] Sueoka K;Akatsuka M;Katahama H et al.[J].Journal of the Electrochemical Society,1999,146(01):364.
[64] Yamada N;Yamada-kaneta H .[J].Journal of the Electrochemical Society,1998,145:3628.
[65] Abe Hidenobu;Suzuki Isamu;Koya Hiroshi .[J].Journal of the Electrochemical Society,1997,144(01):306.
[66] Stesmans A;Afanasev V V .[J].Materials Science and Engineering B,1999,58:71.
[67] Binns M J;Newman R C;Mcquaid S et al.[J].Materials Science Forum,1995,196-201:861.
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