欢迎登录材料期刊网

材料期刊网

高级检索

SOI材料被誉为"二十一世纪硅集成电路技术"的基础. 它可消除或减轻体硅中的体效应、寄生效应及小尺寸效应等, 在超大规模集成电路、光电子等领域有广阔的应用前景. 介绍了注氧隔离、智能剥离、硅片剥离及外延层转移等几种主要的制备SOI材料的方法及近期相关的研究成果. 降低制造成本、提高材料质量以及获得足够薄的顶部硅层是近年来SOI材料制备技术改进的目标.

参考文献

[1] 考林基 J P;武国英.SOI技术—21世纪的硅集成电路技术[M].北京:科学出版社,1993
[2] 杰克逊 K A;屠海令;万群.半导体工艺[M].北京:科学出版社,1999:359.
[3] Manasevit H M;Simpson W I .[J].Journal of Applied Physics,1964,35:1349.
[4] Yaron G;Hess L D .Solid State Electronics[J].IEEE Transactions on Electron Devices,1980,23(27):573.
[5] Vasudev P K;Mayeer D C.[A].Materials Research Society Symposium Proceedings,1984:35.
[6] Jastrzebski L;Corboy J F;McGinn J T et al.[J].Journal of Electrochem Sci,1983,130:1571.
[7] Zing R P;Graf H G;Appel W.[J].Proc IEEE SOS/SOI Technology Workshop,1988:52.
[8] Schubert P J;Neudcck G W .[J].IEEE Transactions on Electron Devices,1990,11:181.
[9] Hemment P L F.Semiconductor-on-Insulator and Thin Film Transistor Technology[A].,1986:207.
[10] Jaussaud C.Silicon-on-Insulator and Buried Metals in Semiconductor[A].MRS Symposium Proceedings,1988:17.
[11] Bussmann U et al.[J].Nuclear Instruments and Methods in Physics Research,1991,B55:852.
[12] Nakshima S;Katayama T;Miyamura Y.Thickness increment of buried oxide in a SIMOX wafer by high-temperature oxidation[M].IEEE int.Conf.SOI Prod., SOI Proc,1994:71.
[13] Sadao N .[J].IECE Trans Electron,1997,E80-C(03):3.
[14] Laskey J B .[J].Applied Physics Letters,1986,48:78.
[15] Shimbo M;Furukawa K;Fukuda K et al.[J].Journal of Applied Physics,1986,60:2987.
[16] Ljungberg K;Soderbarg A;Backlund Y .[J].Applied Physics Letters,1993,62:1362.
[17] Tong Q Y;Schmidt E;Gosele U et al.[J].Journal of Applied Physiology,1994,64:625.
[18] Himi H;Matsui M;Fujino S et al.[J].Journal of Applied Physics,1994,33:6.
[19] 王敬;屠海令;刘安生 等.[J].稀有金属,1998,22(05):390.
[20] 王敬,屠海令,刘安生,周旗钢,朱悟新,张椿.SOI键合材料的TEM研究[J].稀有金属,1998(04):274-276.
[21] Maszata W P;Goetz G;caviglia A et al.[J].Journal of Applied Physics,1988,64:4943.
[22] Mumora P B;Gardopee G J;Feng T.Plasma-Thinned Silicon-On-Insulator Bonded Wafers[C].Proc.Electrochemical Soc.,2nd Intern.Symp.On Semiconductor Wafer Bonding,Honolulu,Hawaii,1993:410.
[23] Akasaka Y Ext .Abstracts of 5th Internat[R].Workshop on fu ture Electron devicess, Kochi, Japan,1990.
[24] Bruel M. .Silicon on insulator material technology[J].Electronics Letters,1995(14):1201-1202.
[25] Bruel M;Aspar B;Maleville C et al.[J].Proc of the Intern Symp on SOI technology and Devices Ed S Cristolovenu,1997,23:3.
[26] Gao M.;Li JM.;Wang FL.;Duan XF. .A TRANSMISSION ELECTRON MICROSCOPY STUDY OF MICROSTRUCTURAL DEFECTS IN PROTON IMPLANTED SILICON[J].Journal of Applied Physics,1996(8):4767-4769.
[27] Johnson N M;Ponce F A;Street R A et al.[J].Physical Review B,1987,35:4166.
[28] Jeng S J;Oehrlein G S;Scilla G J .[J].Applied Physics Letters,1988,53:1735.
[29] 王敬,屠海令,刘安生,张椿,周旗钢,朱悟新,高旻,李建明.氢离子注入硅片退火行为的高压电镜原位观察[J].中国有色金属学报,1998(04):626-630.
[30] Paul K Chu;Shu Qin;Chung Chan et al.[J].IEEE Transactions on Plasma Science,1998,26(01):79.
[31] Sakaguchi K;Sato N;Yamagata K et al.Current Progress In Epitaxial Layer Transfer(ELTRAN)[J].IECE Trans Electron,1997,E80(03):378.
[32] 黄庆安.硅微机械加工技术[M].北京:科学出版社,1996:19.
[33] Herino R;bomchil G;Barla K et al.[J].Journal of the Electrochemical Society,1987,134(08):1994.
[34] Sakaguchi K;Sato N;Yamagata K et al.Extremely high selective etching of porous Si for single etch-stop bond-and-etch-back silicon-on-insulator[M].Ext.Abst.1994 Int.Conf.SSDM, Yokohama, Japan, 259, August 1994, and Jpn.J.Appl.Phys,1995,34(2B):842.
[35] Sato N;Yonehara T .Hydrogen annealed silicon-on-insulator[J].Applied Physics Letters,1994,65(15):1924.
[36] Sakaguchi K;Yanagita K;Kurisu H et al.ELTRANTM by Splitting Porous Si Layers, Proc. 195th Int. SOI Symposium[J].Electrochemical Society Seattle,1999,99-3:117.
[37] Ohshima S.[A].,1998
[38] Sakaguchi K;Yonehara T .SOI Wafers Based On Epitaxial Technology[J].Solid State Technology,2000,6:88.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%