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用MBE设备以Stranski-Krastanov 生长方式外延生长了5个周期垂直堆垛的InAs量子点, 在生长过程中使用对形状尺寸控制法来提高垂直堆垛InAs量子点质量和均匀性. 样品外延的主要结构是 500 nm 的GaAs外延层, 15 nm的Al0.5Ga0.5As势垒外延层, 5个周期堆跺的InAs量子点, 50 nm的Al0.5Ga0.5As nm 势垒外延层等. 在生长过程中用反射式高能电子衍射仪(RHEED)实时监控. 生长后用原子力显微镜(AFM)进行表面形貌的表征, 再利用光制发光(PL)对InAs量子点进行观测.

参考文献

[1] Xie Q;Madhukar A;Chen P et al.Vertically self-organized InAs quantum box islands on GaAs (100)[J].Physical Review Letters,1995,75:2542.
[2] Solomon G;Trezza J;Marshall A et al.Vertically aligned and electronically coupled growth induced InAs islands in GaAs[J].Physical Review Letters,1996,76:952.
[3] Koike K.;Yano M.;Li SW. .Molecular beam epitaxial growth and characterization of the vertically aligned InAs quantum dots embedded in Al0.5Ga0.5As[J].Japanese journal of applied physics,2000(4A):1622-1628.
[4] Koike K;Saitoh K;Li S et al.Room-temperature operation of a memory-effect AlGaAs/GaAs heterojunction field-effect transistor with self-assembled InAs nanodots[J].Applied Physics Letters,2000,76:1464.
[5] Edeiros-Ribeiro G;Leonard D;Petroff P .Electron and hole energy level in InAs self-assembled quantum dots[J].Applied Physics Letters,1995,66:1767.
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