通过低温强磁场下的磁输运实验,研究了AlxGa1-xN/GaN调制掺杂异质结构二维电子气(2DEG)的能带分裂性质.1.4 K温度下测量的磁阻曲线当磁场强度大于5.4 T时观察到的明显对应于第一子带的自旋分裂现象.用Dingle作图法得到本样品τq的大小为0.17 ps.结果表明,本实验所用的调制掺杂Al0.22Ga0.78N/GaN异质结构具有较大的有效g因子g*.用高2DEG浓度导致的交换相互作用加强解释了g*增强效应.在磁阻测量中改变磁场方向,自旋分裂现象表现出各向异性.用异质结构界面处强的极化电场解释了自旋分裂的各向异性.
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