以醋酸锌为溶质、碳酸钠为钠源,采用溶胶-凝胶法在Si〈100〉衬底上制备了钠掺杂ZnO薄膜,掺杂浓度分别为0,0.018,0.036,0.045,0.063和0.09 mol/L.研究了钠掺杂后ZnO晶胞尺寸和表面形貌的变化规律,用霍尔效应仪测试了试样的载流子浓度及导电类型,分析了材料的拉曼光谱与试样内部缺陷浓度的关系.结果表明:Na+离子可进入ZnO晶格取代Zn2+,导致晶胞变大,同时ZnO薄膜由n-型转变为p-型导电;当Na+掺杂浓度达0.045 mol/L时,其电阻率为75.7Ω·cm,空穴浓度2.955×1017 /cm3.
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