对提拉法生长的钼酸钆晶体进行了从常温(25℃)到高温(1127℃)的喇曼光谱测试和分析,由实验得出:随着温度的不断升高,晶体的喇曼谱峰向低频移动(159℃相变点除外),且总的趋势是向一起靠拢,位置相近的谱峰合并或趋于合并,这说明随着温度的升高晶体结构不断变化-晶体中三种MoO4四面体的结构逐渐趋于一致.用经验关系式υ(cm-1)=32895exp(-2.073r),由实验测得的晶体在不同温度下的喇曼伸缩振动频率值估算了相应温度下晶体中MoO4四面体的Mo-O键的键长值,明显看出,随着温度的升高,各不同的四面体的键长值趋于一致,从而定量估算出晶体结构随温度的变化情况.
参考文献
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