采用蒙特卡罗方法,对以CH4/H2混合气体为源气体的EACVD中的氢原子发射过程进行了模拟.研究了不同实验条件下产生的H、CH3的数目与氢原子谱线相对强度的关系,给出了一种利用氢原子谱线来获得最佳成膜实验条件的方法.本工作对于有效控制工艺条件,生长出高质量的金刚石薄膜具有重要意义.
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