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随着InGaP2/InGaAs/Ge三结太阳电池技术日趋成熟,具有更高理论效率的基于GaAs体系的四结电池新材料AlInGaP/InGaAs/?(新材料)/Ge已经受到人们的关注,经过计算,要求新材料的禁带宽度应该为0.95eV~1.05eV.InxGa1-xAs1-xNy材料的禁带宽度可以调整为0.95eV~1.05eV,是有望实现突破的材料.我们通过选取合适的生长方案,在D180MOCVD系统上外延生长了InxGa1-xAs1-yNy材料,并通过高分辨X光双晶衍射仪、分光光度计以及电化学电容-电压(EC-V)测试仪等对材料性能进行了分析.获得了室温下禁带宽度为1.17eV的InxGa1-xAs1-xNy材料.

参考文献

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[7] Kurtz S R;Allerman A A;Seager C H et al.Minority Carrier Diffusion,Defects,and Localization in InGaAsN,with 2% Nitrogen[J].Applied Physics Letters,2000,77:400.
[8] Zhang SB.;Wei SH. .Nitrogen solubility and induced defect complexes in epitaxial GaAs : N[J].Physical review letters,2001(9):1789-1792.
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[10] Ptak A J;Kurtz Sarah;Curtis C et al.Incorporation Effects in MOCVD-grown InGaAsN Using Different Nitrogen Precursors[J].Journal of Crystal Growth,2002,243:231.
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