为了降低成本、提高镀层质量和镀液的稳定性,以混合配位体(EDTA·2Na)代替THPED(四羟丙基乙二胺),系统研究了THPED和EDTA·2Na盐双配位体化学镀铜体系.对镀速、镀液稳定性及镀层附着力的研究结果表明,镀速随EDTA·2Na盐、硫酸铜和甲醛浓度的增加先升高后降低;随THPED浓度的增加先降低后升高;随溶液pH值和镀液温度增加而升高;添加剂亚铁氰化钾、α,α'-联吡啶和2-MBT虽均使镀速减慢,但能使镀层外观变好;聚乙二醇-1000(PEG-1000)对镀速影响较小,但能使镀层质量变好.其化学镀铜最佳条件为THPED 10.0 g/L,EDTA·2Na 8.7 g/L,CuSO4·5H2O 12.0 g/L,甲醛(37%~40%)16.0 mL/L,α,α'-联吡啶10.0 mg/L,亚铁氰化钾40.0 mg/L,PEG-1000 1.0 g/L,2-MBT(二巯基苯骈噻唑) 0.5 mg/L,pH值13.2及镀液温度50 ℃.在最佳条件下获得的镀层外观红亮、表面平整,镀液稳定,镀速达到4.05 μm/h.由SEM分析可知,镀层表面平整、光滑、晶粒细致.
参考文献
[1] | Dutkewych O B .Ductile Electroless Copper[P].US 4695505,1987-09-22. |
[2] | Cheryl A. Deckert .Electroless Copper Plating A Review: Part Ⅱ[J].Plating & Surface Finishing,1995(3):58-64. |
[3] | C.T. Pan .Selective electroless copper plating micro-coil assisted by 248 nm excimer laser[J].Microelectronic engineering,2004(3/4):242-251. |
[4] | Lin WH.;Chang HF. .Effect of chelating agents on the structure of electroless copper coating on alumina powder[J].Surface & Coatings Technology,1998(1):48-54. |
[5] | 伍学高;李铭华.化学镀技术[M].成都:四川科学技术出版社,1985 |
[6] | S.-C. Kou;A. Hung .Effect of Buffer On Electroless Copper Deposition[J].Plating & Surface Finishing,2002(2):48-52. |
[7] | Norkus E;Vaskelis A;Zakaite I .Polarographic Investigation of Cu(Ⅱ) Complexes with N,N,N',N'-tetrakis(2-hydroxypropyl)ethylenediamine[J].Talanta,1995,42:1701-1705. |
[8] | 李宁.化学镀实用技术[M].北京:化学工业出版社,2004 |
[9] | Mishra KG.;Paramguru RK. .KINETICS AND MECHANISM OF ELECTROLESS DEPOSITION OF COPPER[J].Journal of the Electrochemical Society,1996(2):510-516. |
[10] | 董超.添加剂对化学镀铜的影响[J].材料保护,1997(01):8. |
[11] | 谷新,胡光辉,林昌健,王周成.化学镀铜过程混合电位本质的研究[J].物理化学学报,2004(02):113-117. |
[12] | Oita M;Matsuoka M;Iwakura C .Deposition rate and morphology of electroless copper film from solutions containing 2,2'-dipyridyl[J].Electrochimica Acta,1997,42(09):1435-1440. |
[13] | Nuzzi F J .Accelerating the rate of electroless copper plating[J].Plating and Surface Finishing,1983,70(01):51-54. |
[14] | 姜晓霞;沈伟.化学镀理论及实践[M].北京:国防工业出版社,2000 |
[15] | Hanna F;Hamid Z A;Aal A A .Controlling factors affecting the stability and rate of electroless copper plating[J].Materials Letters,2003,58:104-109. |
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