采用复合电沉积制备Ni-ZrO2复合层.采用X-射线衍射检测ZrO2的加入对镍镀层结构的影响,如衍射峰的强度、金属电沉积时晶粒的择优取向.测试表明,Ni和ZrO2各自在特定的角度分别出现其独特的衍射特征峰,互不干扰,镀层中ZrO2含量增高,衍射强度变强.ZrO2在镀层的掺杂,镀层的晶粒尺寸由29.29 nm降至21.78 nm,镀层晶粒细化.
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