采用电沉积法制备了V2 O5薄膜并研究了电沉积温度、时间、电压和镀液浓度对V2O5薄膜储钠性能的影响.采用场发射扫描电镜和X-射线衍射表征了V2 O5薄膜表面形貌和晶体结构;利用循环伏安、充放电测试V2O5薄膜的储钠性能.结果表明,制备的V2O5薄膜是非晶相V2O5水合物,该薄膜具有片状的叠层纳米结构;电沉积条件对V2O5薄膜沉积速度和储钠性能都有显著影响,随着电沉积温度的升高和镀液浓度的增加,薄膜的沉积速度加快;随着电沉积电压的增加,薄膜沉积速度先增加后降低,在电压为2.5V时沉积速度最大;随着电沉积时间的增加,薄膜厚度增大;薄膜的储钠性能与薄膜厚度密切相关,薄膜过薄或过厚都不利于其储钠性能的提高.
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