对3种不同Ag含量材料(Sn-3.0Ag-0.5Cu,Sn-1.0Ag-0.5Cu,Sn-0.3Ag-0.7Cu)的焊点进行跌落实验,实验中施加的加速度载荷为峰值3200g,脉冲持续时间1ms的半正弦波形加速度,利用电学测试、光学显微镜和扫描电子显微镜确定了失效的焊点并对失效焊点进行分析.结果表明:3种材料焊点的失效位置基本都在靠近印刷电路板(PCB)侧,BAG封装最外围4个拐角处的焊点最先失效.Sn-3.0Ag-0.5Cu,Sn-1.0Ag-0.5Cu焊点的失效模式均为脆性断裂,Sn-0.3Ag-0.7Cu为韧-脆混合断裂.且随着Ag含量的降低,金属间化合物(IMC)的厚度逐渐减小,焊点的寿命逐渐提高.
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