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采用动电位扫描极化曲线、电化学阻抗谱、Mott-Schottky曲线等电化学测试方法,研究了在室温0.1 M Na2SO4溶液条件下,不同极化电位对锆合金钝化膜性能的影响.结果表明,锆合金表面钝化膜表现出n型半导体性质,随着极化电位的增加,锆合金钝化膜缺陷密度下降,半导体性质减弱,阻抗值增大.阻抗谱可以用RQ并联后与溶液电阻Rs串联的等效电路来拟合.在相同的极化电位下,含Nb的N18合金表面钝化膜的缺陷密度要小于出厂退火态Zr-4合金.

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