用X射线衍射仪、原子力显微镜和磁强计研究了Ta缓冲层厚度变化时,Ta/FeMn/NiFe/Ta多层膜微观结构和磁性能的变化,分析了其微观结构和磁性能之间的关系。实验结果表明,随 Ta 缓冲层厚度增加,FeMn层织构、晶粒尺寸、位错密度、应变和界面粗糙度都发生明显变化,并且这些变化影响了多层膜的偏置场(H ex )和矫顽力(H c )的大小。结合实验现象和交换偏置(EB)的物理本质,讨论了微观结构对交换偏置的影响机理。
Microstructures and magnetic properties of the Ta/NiFe/FeMn/Ta system with Ta buffer layer thick-ness varying were investigated by X-ray diffraction,atomic force microscope,and vibrating film magnetometer, respectively.Experimental results show that FeMn texture,grain size,dislocation density,strain rate and in-terface roughness changed a lot with the thickening Ta buffer layer.And the change of microstructures finally acts on the values of bias field (H ex )and coercivity (H c ).Combining with the experimental results and the physical essence of exchange biasing (EB),we analyzed the mechanism of microstructures change on EB.
参考文献
| [1] | Jungblut R.;Johnson MT.;Sauer C.;Vanderzaag PJ.;Ball AR. Rijks TGSM.;Destegge J.;Reinders A.;Coehoorn R..EXCHANGE BIASING IN MBE-GROWN NI80FE20/FE50MN50 BILAYERS[J].Journal of Magnetism and Magnetic Materials,19951/2(1/2):300-306. |
| [2] | Park CM.;Shin KH.;Min KI..EFFECTS OF SURFACE TOPOLOGY AND TEXTURE ON EXCHANGE ANISOTROPY IN NIFE/CU/NIFE/FEMN SPIN VALVES[J].Journal of Applied Physics,19968 Pt.2b(8 Pt.2b):6228-6230. |
| [3] | Liu CX.;Jiang HM.;Shen LY.;Alexander C.;Mankey GJ.;Yu CT..Effect of interface roughness on the exchange bias for NiFe/FeMn[J].Journal of Applied Physics,20009 Pt.3(9 Pt.3):6644-6646. |
| [4] | V.P. Nascimento;E.C. Passamani;A. Biondo;V.B. Nunes;E. Baggio Saitovitch.Properties of the roughness in NiFe/FeMn exchange-biased system[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,200714(14):6248-6254. |
| [5] | Zheng-qi Lu;Wu-yan Lai;Chun-lin Chai.The effect of microstructure and interface conditions on the exchange coupling fields of NiFe/FeMn[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,20001/2(1/2):224-227. |
| [6] | Jen-Hwa Hsu;An-Cheng Sun;Puneet Sharma.Lateral grain size effect on exchange bias in polycrystalline NiFe/FeMn bilayer films[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2013Sep.2(Sep.2):87-90. |
| [7] | F.T. Yuan;C.Y. Tsai;Jen-Hwa Hsu;K.F. Lin;J.K. Mei.Ta/NiFe/FeMn thin films with enhanced exchange bias prepared at room temperature by rotational deposition[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2013Jun.1(Jun.1):244-248. |
| [8] | Takano K;Kodama RH;Berkowitz AE;Cao W;Thomas G;UNIV CALIF BERKELEY DEPT MAT SCI & MINERAL ENGN BERKELEY CA 94720..Interfacial uncompensated antiferromagnetic spins: Role in unidirectional anisotropy in polycrystalline Ni81Fe19/CoO bilayers[J].Physical review letters,19976(6):1130-1133. |
| [9] | Li MH;Yu GH;Zhu FW;Zeng DC;Lai WY.Influence of metal spacer on the properties and microstructure of multilayer films and analyses[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,20088(8):2058-2062. |
| [10] | N. Rajasekaran;S. Mohan.Structure, microstructure and corrosion properties of brush-plated Cu-Ni alloy[J].Journal of Applied Electrochemistry,200910(10):1911-1916. |
| [11] | Li MH.;Cai JW.;Yu GH.;Jiang HW.;Lai WY.;Zhu FW..Effect of Cu surface segregation on properties of NiFe/FeMn bilayers[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,20023(3):296-300. |
| [12] | Bailey WE.;Sinclair R.;Wang SX.;Zhu NC..STRUCTURAL COMPARISONS OF ION BEAM AND DE MAGNETRON SPUTTERED SPIN VALVES BY HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY[J].Journal of Applied Physics,19968 Pt.2b(8 Pt.2b):6393-6395. |
| [13] | Remi Dingreville;Jianmin Qu;Mohammed Cherkaoui.Surface free energy and its effect on the elastic behavior of nano-sized particles, wires and films[J].Journal of the Mechanics and Physics of Solids,20058(8):1827-1854. |
| [14] | Lin SS;Huang JL.Effect of thickness on the structural and optical properties of ZnO films by r.f. magnetron sputtering[J].Surface & Coatings Technology,20042/3(2/3):222-227. |
| [15] | M. Boubatra;A. Azizi;G. Schmerber;A. Dinia.Morphology, structure, and magnetic properties of electrodeposited Ni films obtained from different pH solutions[J].Journal of Materials Science. Materials in Electronics,201112(12):1804-1809. |
| [16] | J. Nogues;I.K. Schuller.Exchange bias[J].Journal of Magnetism and Magnetic Materials,19992(2):203-232. |
| [17] | Entani S;Kiguchi M;Ikeda S;Saiki K.Magnetic properties of ultrathin cobalt films on SiO2 substrates[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,20051/2(1/2):221-225. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分：
-
10%
-
20%
-
30%
-
40%
-
50%