提出了沉积温度突变时黑色缺陷形成的孪晶机制模型.这一模型提出的基本假设为:沉积温度改变时,金刚石膜的表面上产生贯穿型的孪晶,孪晶以及原来的晶粒的各晶面均将按α2d所规定的生长速率扩张,在生长时相邻晶粒的晶界处形成了一种形如"峡谷"状的、相邻晶面夹角过小的局部环境,后者将导致活性气体扩散的过程难于进行,从而形成黑色缺陷.在此假设的基础上,利用水平集方法对此模型进行了二维的模拟,并通过实验进行了验证.模拟及实验的结果表明,在金刚石膜沉积的过程中,沉积温度的突变将通过在众多金刚石晶粒的表面诱发产生孪晶,显著提高金刚石膜中黑色缺陷的形成几率.
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