基于氢渗透数学模型的三种不同解法,用Microsoft Visual C++6.0编制数据采集模拟分析程序,配合VtoolsD开发的A/D卡驱动程序(包括用来访问、控制A/D卡的动态连接库dll和虚拟设备驱动程序VxD)构成一套完整的"计算机辅助氢损伤监测系统",给定不同的参数,分析在电化学渗氢联机试验过程中各种因素对氢渗透的影响,并对所采集的数据进行分析处理,以图形的形式把分析结果显示在屏幕上,最后验证整个数据采集与分析系统的稳定性和可靠性.
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