用内耗分析方法研究了Ni-Mn-Ga磁性记忆合金的相变行为.发现多晶材料也存在着由温度诱发的完整的热弹性中间马氏体相变.在发生中间马氏体相变过程中,内耗明显增高,同时,弹性模量发生突变,表明相变前和相变后材料的模量有较大的差异.在相变过程中没有观察到软模现象.
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