对102×64点阵的单色被动驱动的有机电致发光(OLED)矩阵屏进行了老化研究.矩阵屏的结构为ITO/CuPc/ NPB/Alq3:C545/LiF/Al.测量了老化前后矩阵屏的电流-电压-亮度曲线,以及电致发光(EL)和光致发光光谱(PL).比较发现,老化后的器件在同样恒电流的情况下表现出更高的驱动电压,更小的漏电流,以及在阴极和有机层界面上电致发光和光致发光的光谱强度减弱.矩阵屏在老化17 h后,电致发光和光致发光的强度分别降低到初始值的75.6 %和81.4 %,分析认为,这是因为老化过程中部分发光材料分解,从而造成对矩阵屏的永久损伤.
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