欢迎登录材料期刊网

材料期刊网

高级检索

采用直流磁控溅射法在普通载玻片上制备了氧化铟锡透明导电薄膜(ITO).制备出的薄膜在大气环境下退火,退火温度分别为100℃、200℃和300℃,保温时间为1 h.对薄膜中铟锡原子的氧化程度及其光电特性进行了测试与分析.结果表明:退火温度的升高,有助于提高ITO薄膜中Sn原子氧化程度,从而提高了薄膜在可见光范围内的透射率;退火温度为200℃时,In原子氧化程度较高,薄膜中氧空位数量最多,电阻率最低为6.2×10-3Ω·cm.

参考文献

[1] Minami T,Sonohara H,Kakumu T,et al.Physics of very thin ITO conducting films with high transparency prepared byDC magnetron sputtering[J].Thin Solid Films,1995,270(1-2):37-42.
[2] Bhatti M.Tariq,Rana Anwar Manzoor,Khan Abdul Faheem.Characterization of rf-sputtered indium tin oxide thin films[J].Materials Chemistry and Physics,2004,84(1):126-130.
[3] Akkad FEI,Punnoose A,Prabu G.Properties of ITO films prepared by rf magnetron sputtering[J].Phys.A,2000,71(2):157-160.
[4] 翟琳,仲飞,刘彭义.磷酸处理ITO基底对有机发光二极管性能的改善[J].液晶与显示,2006,21(5):451-455.
[5] Kim Daeil,Kim Sungjin.AFM observation of ITO thin films deposited on polycarbonate substrates by sputter type negative metal ion source[J].Surface and Coatings Technology,2003,176(1):23-29.
[6] Yutaka Sawada,Chikako Kobayashi,Shigeyuki Seki,et al.Highly-conducting indium-tin-oxide transparent films fabricated by spray CVD using ethanol slution of indium(Ⅲ) chloride and thin(Ⅱ) chloride[J].Thin Solid Films,2002,409(1):46-50.
[7] 刘永兴,王承遇,马腾才,等.用强流脉冲离子束(HIPIB)方法在玻璃表面制备ITO膜[J].硅酸盐通报,2001,20(2):11-16.
[8] 马颖,吕庆莉,张方辉,等.锡掺杂对ITO膜方阻和结构的影响[J].液晶与显示,2006,21(5):460-465.
[9] Alam M J,Cameron D C.Characterization of transparent conductive ITO thin films deposited on titanium dioxide film by a sol-gel process[J].Surface and Coatings Technology,2001,142-144:776-780.
[10] 范志新,孙以材,陈玖琳.氧化物半导体透明导电薄膜的最佳掺杂含量理论计算[J].半导体学报,2001,22(11):1382-1386.
[11] 杨田林,王爱芳,韩圣浩.SnO2的含量对ITO透明导电薄膜结构和光电特性的影响[J].光电子技术,2004,24(2):89-92.
[12] 张树高,黄伯云,方勋华.ITO薄膜的半导体化机理、用途[J].材料导报,1997,11(4):11-14.
[13] 刘恩科,朱秉升,罗晋生.半导体物理学[M].北京:国防工业出版社,1994:86-88.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%