提出一种由X-射线发生器、光学光纤、荧光光谱仪组成的用于测定X-射线发光材料的新装置.该设备可以测定X-射线发光材料的荧光强度随着波长的变化曲线、荧光强度随着激发时间的变化曲线、余辉衰减随着时间的变化曲线以及余辉时间等.研究了X射线发光材料在不同时间段的光谱特征.
A new instrument for X-ray luminescence spectrum was established in order to study properties of X-ray luminescence materials,which consists of X-ray generator, optical fiber and fluorescence spectrophotometer and can determine spectral distribution graph, time-change graph, afterglow decay curve. The results showed that both of stability and precision are fine and relative standard deviation(RSD)is less more than 2%. The instrument simplifies the process for determining X-ray luminescence materials.
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