利用硅压阻力学芯片传感器作为原位监测的载体,研究了直接粘贴芯片的封装方式中,芯片在基板上的不同位置对于封装后残余应力的影响以及在热处理过程中残余应力的变化,发现粘贴在基板靠近边的位置和中心位置时应力水平接近,但是靠近基板一角的位置应力较大,而且在热处理过程中应力出现"突跳"和"尖点".
参考文献
[1] | A. S. Voloshin;P. -H. Tsao;R. A. Pearson .In situ evaluation of residual stresses in an organic die-attach adhesive[J].Journal of Electronic Materials,1998(3):314-318. |
[2] | Bittle D A;Suhling J C;Beaty R E et al.Piezoresistive stress sensors for structural analysis of electronic packages[J].ASME Journal of Electronic Packaging,1991,113:203-215. |
[3] | Prema Palaniappan;Daniel F. Baldwin;Paul J. Selman;Jaili Wu;C. P. Wong .Correlation of Flip Chip Underfill Process Parameters and Material Properties with In-Process Stress Generation[J].IEEE transactions on electronics packaging manufacturing: A publication of the IEEE Components, Packaging, and Manufacturing Technology Society,1999(1):53-62. |
[4] | Zou Y;Suhling J C;Jaeger R C.Die surface stress variation during thermal cycling and thermal aging reliability tests[A].,1999 |
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