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用常规射频(RF)溅射系统,采用两步法在Si(111)衬底上制备出较高粘附性的立方氮化硼(c-BN)薄膜.沉积过程分为成核(第一步)和生长(第二步)两步,当由第一步变为第二步时,工作气体由Ar气变为Ar和N2的混合气体,衬底温度和偏压也降为较低的值.对不同生长阶段的薄膜进行了SEM、FTIR分析,对最后沉积的薄膜进行了XPS分析.结果表明:采用两步法在Si(111)衬底上沉积的c-BN薄膜内应力较之常规方法减小约11.3GPa,薄膜的B、N原子之比为1.01,c-BN的体积分数为88%,薄膜置于自然环境中6个月尚未有剥离现象.文中还讨论了c-BN薄膜的综合生长机制.

参考文献

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