以 H2O作氧源, Zn(C2H5)2作 Zn源, N2作载气,以 GaN/Al2O3为衬底采用常压 MOCVD技术 生长了高质量的 ZnO单晶膜.用 X射线双晶衍射技术测得其对称衍射 (0002)面ω扫描半峰宽 ( FWHM)为 404arcsec,表明所生长的 ZnO膜具有相当一致的 C轴取向;其对称衍射( 0004)面ω- 2θ扫描半峰宽为 358arcsec,表明所生长的 ZnO单晶膜性能良好;同时,该 ZnO薄膜的非对称衍射 (1012)面ω扫描半峰宽为 420arcsec,表明所生长的 ZnO膜的位错密度为 108cm- 2,与具有器件质 量的 GaN材料相当.
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