研究了γ射线辐照对 InGaAs红外探测器性能的影响.γ射线的辐照剂量分别为 10Mrad、 20Mrad、 30Mrad.测量了器件在不同γ辐照剂量下的响应光谱、电流-电压特性、信号、噪声.通 过对实验结果的分析,发现器件的响应光谱和信号没有发生明显变化;暗电流和噪声随γ辐照剂 量增加而递增,表明探测器的性能随γ辐照剂量的增加而逐步衰减.
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