实验设计并组建了一套磁光极克尔磁滞回线测量装置,该装置可以通过改变照射到样品上 的激光功率来改变薄膜样品上被聚焦光斑照射的测试点的温度.同时通过计算模拟了激光照射 在 TbFeCo磁光薄膜上的温度分布情况,得到了薄膜的矫顽力随照射激光功率的变化关系,由此可 以确定薄膜的居里温度和补偿温度.为研究磁光薄膜样品在各种温度条件下,磁光性能的变化以 及多层磁光薄膜的磁耦合效应提供了有效的手段.
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