选用垂直于其表面的射频磁场对镀金膜的硅片进行了感应加热,由于磁场对材料加热具有选择性,感应热量首先作用于硅片上的金膜内,硅片先被传导加热到一定温度,然后被感应加热.理论上分析了该方法的可行性,初步试验结果表明,虽然金膜厚度低于感应趋肤深度,但在没有应用感应加热基座的情况下,几秒钟内就形成了金硅共晶相.另外,升温速度快,有效减少了加热过程中金对硅的扩散影响,该方法可广泛用于微系统封装中的圆片键合.
Induction heating of the gold film deposited on a silicon substrate in a radio - frequency magnetic field perpendicular to the film surface was demonstrated. Owing to electromagnetic field selective heating materials, the energy is first deposited in the gold portion and then the substrate is conductively and inductively heated. Theoretical analyses show the feasibility of this induction heating, and preliminary experimental results show that it takes only a few seconds to produce the gold -silicon eutectic phase,despite the fact that the thickness of the gold layer is less than a skin - layer depth and no additional susceptor is required. Moreover, the characteristic property of the method is that short process - time allows for minimal diffusion of the gold into silicon and this fast heating technique can be used for wafer bonding of microsystem packaging.
参考文献
[1] | Martin A. Schmidt .Wafer-to-wafer bonding for microstructure formation[J].Proceedings of the IEEE,1998(8):1575-1585. |
[2] | Wen H Ko .Review:Packaging of microfabricated devices and systems[J].Materials Chemistry and Physics,1995,42:169-175. |
[3] | Tong Y Q;Gosele U.Semiconductor wafer bonding:science and technology[M].New York:John Wiley and Sons,Inc,1999:1-13. |
[4] | Nai S M L;Wei J;Lim P C.Silicon-to-silicon wafer bonding with gold as intermediate layer[A].,2003:119-124. |
[5] | Hsueh-An Yang;Mingching Wu;Weileun fang .Localized induction beating solder bonding for wafer level MEMS packaging[J].Journal of Micromechanics and Microengineering,2005,15:394-399. |
[6] | Andrew Cao;Liwei Lin.Selective induction heating for MEMS packaging and fabrication[A].,2001:763-767. |
[7] | Chen Mingxiang;Yi Xinjian;Yuan Liulin.Selective Induction Heating for Sensor Packaging[A].,2005:288-290. |
[8] | Keith Thompson;Yogesh B. Gianchandani;John Booske;Reid F. Cooper .Direct silicon-silicon bonding by electromagnetic induction heating[J].Journal of Microelectromechanical Systems: A Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems,2002(4):285-292. |
[9] | M. Sinder;J. Pelleg;V. Meerovich;V. Sokolovsky .RF heating of the conductor film on silicon substrate for thin film formation[J].Materials Science & Engineering, A. Structural Materials: Properties, Misrostructure and Processing,2001(1):31-36. |
[10] | Wolffenbuttel RF. .LOW-TEMPERATURE INTERMEDIATE AU-SI WAFER BONDING - EUTECTIC OR SILICIDE BOND[J].Sensors and Actuators, A. Physical,1997(1/3):680-686. |
[11] | Chang P H;Berman G;Shen C C .TEM of gold-silicon interactions on the backsides of silicon wafers[J].Journal of Applied Physics,1988,63(05):1473-1477. |
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