研究了化学表面处理对微型化的氮氧化硅膜电荷稳定性的影响,考察了表面处理对脱阱面电荷横向扩散的抑止作用.借助对微型化前后的样品在高温和高湿环境中的表面电位衰减测量的对比,研究了不同试剂的表面处理对微型化样品的电荷储存及其动态特性的影响.
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