基于电荷控制模型,分析了极化,载流子迁移率,饱和电子漂移速度,导带断续,掺杂浓度,沟道温度等与自然效应的关系,并考虑了寄生电阻对自热效应的影响,建立了模拟AlGaN/GaN高电子迁移率晶体管直流Ⅰ-Ⅴ特性的解析模型.通过与试验值的对比,该模型具有较高的精度,并且计算过程简单,可以用来指导器件结构和电路的设计.
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