本文介绍了一种基于内存故障注入和总线故障注入相结合的单粒子事件故障注入系统.首先介绍了故障注入系统的功能及框架,然后以通用性和可扩展性为前提,对实现故障注入器的关键技术进行了探讨.测试结果表明,利用本文介绍的故障注入系统,具有成本低、通用性强、故障注入方便快捷、全动态实时和定量注入等特点.
参考文献
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[3] | Cheng Kangting,Huang Shiyu,Dai Weijin.Fault emulation:a new methodology for fault grading [J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.1999,1487~1495 |
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