利用LP-MOCVD生长了不同周期的AIGaInP/GaInP MQW样品,并测量了它们的拉曼光谱.由于样品包括了掺杂的电流扩展层和欧姆接触层以及上、下限制层,拉曼光谱中观察到了与掺杂有关的耦合电子(空穴)气-纵光学声子模.根据喇曼光谱的选择定则,结合光致发光谱,发现A1P-LO/TO的相对强度比可以评定晶体AlGaInP MQW的生长质量.
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