测量系统采用双旋转延迟器结构,通过两个1/4波片的周期变化,对入射光、散射光的偏振态进行调制.由探测光强的25个Fourier分解系数可以计算得到样品的Mueller矩阵.为了检测测量系统的准确性,将测量的16个自由空间Mueller矩阵分量和理想情况下的自由空间Mueller矩阵分量进行比较,并给出了每个矩阵分量的标准误差.最后,通过测量聚四氟乙烯样品板的Mueller矩阵,定量地分析样品的退偏效应.
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