采用低温辐射计在1064 nm波长对两个硅陷阱探测器(trap O#和trap B)进行绝对光功率响应度定标.描述了定标方法、实验装置和数据的分析方法,提出了低温辐射计窗口的精确复位和窗口透过率的测量方案,测量得到的透过率达到0.999以上.结果表明,两个探测器绝对响应度定标的合成不确定度分别为1.457×10-4和1.458×10-4,定标结果的重复性分别达到了0.014%和0.008%.分析了测量时各项不确定度来源,对光功率响应度定标不确定度进行了评估.对O#硅陷阱探测器在1064 nm波长处光功率响应度的温度稳定性进行了测试研究.
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